Semiconductor device manufacturing: process – Packaging or treatment of packaged semiconductor – Metallic housing or support
Reexamination Certificate
2006-01-20
2008-11-04
Thai, Luan (Department: 2891)
Semiconductor device manufacturing: process
Packaging or treatment of packaged semiconductor
Metallic housing or support
Reexamination Certificate
active
07445967
ABSTRACT:
A method of packaging a semiconductor die includes the steps of providing a flange (110), coupling one or more active die (341) to the flange with a lead-free die attach material (350), staking a leadframe (120) to the flange after coupling the one or more active die to the flange, electrically interconnecting the one or more active die and the leadframe with an interconnect structure (470), and applying a plastic material (130) over the flange, the one or more active die, the leadframe, and the interconnect structure.
REFERENCES:
patent: 5877555 (1999-03-01), Leighton et al.
patent: 5886396 (1999-03-01), Carney et al.
patent: 6072238 (2000-06-01), Viswanathan et al.
patent: 6118175 (2000-09-01), Anderson et al.
patent: 6198163 (2001-03-01), Crowley et al.
patent: 6261868 (2001-07-01), Miller et al.
patent: 6396130 (2002-05-01), Crowley et al.
patent: 6451627 (2002-09-01), Coffman
patent: 2004/0022016 (2004-02-01), Mosna et al.
patent: 2004/0032011 (2004-02-01), Warner et al.
patent: 2005/0191793 (2005-09-01), Brennan et al.
International Search Report and Written Opinion.
Abdo David F.
Elliott Alexander J.
Viswanathan Lakshminarayan
Bryan Cave LLP
Freescale Semiconductor Inc.
Thai Luan
LandOfFree
Method of packaging a semiconductor die and package thereof does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of packaging a semiconductor die and package thereof, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of packaging a semiconductor die and package thereof will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4039387