Data processing: measuring – calibrating – or testing – Calibration or correction system – Timing
Reexamination Certificate
2005-08-02
2005-08-02
Shah, Kamini (Department: 2142)
Data processing: measuring, calibrating, or testing
Calibration or correction system
Timing
C702S107000, C327S160000
Reexamination Certificate
active
06925402
ABSTRACT:
A chip includes CPU (12), memories (13,14) for programs and data, peripheral units (18,19) for interacting with the outside world, and an internal RC oscillator (17) for providing clock signals. One of the peripheral units (18) includes a timer counter incremented at a frequency derived from the RC oscillator. The method does not try to change the frequency of the RC oscillator. Instead, an external calibration source (21) is connected to a capture input of the timer unit to provide a signal having a reference frequency, e.g. the mains frequency. The counter is sampled on active edges of that signal, and the sampled values are processed to derive a calibration ratio. After these calibration steps, a software correction is applied to parameters handled by programs stored in memory based on the calibration ratio to compensate for frequency variations of the RC oscillator.
REFERENCES:
patent: 6326825 (2001-12-01), Walley
patent: 6339413 (2002-01-01), Drake et al.
patent: 6653907 (2003-11-01), Kobota
patent: 2001/0007091 (2001-07-01), Waller et al.
European Search Report dated Dec. 18, 2002 for European Application No. 02291700.
Perier Laurent
Shah Hitesh
Fleit Kain Gibbons Gutman Bongini & Bianco P.L.
Gutman Jose
Jorgenson Lisa K.
Shah Kamini
STMicroelectonics Ltd.
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