Method of multi-level cell FeRAM

Static information storage and retrieval – Systems using particular element – Ferroelectric

Reexamination Certificate

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C365S189011, C365S189090

Reexamination Certificate

active

11064315

ABSTRACT:
Disclosed are use methods, integrated circuits, and manufacturing methods for ferroelectric memory. A data value from multiple data values is received, for example by a state machine controlling the ferroelectric memory. The different data values correspond to different particular durations. The data value corresponding to the selected particular duration is stored in a ferroelectric memory cell by applying voltage to the ferroelectric memory cell for the particular duration.

REFERENCES:
patent: 5495438 (1996-02-01), Omura
patent: 5668754 (1997-09-01), Yamashita
patent: 5999438 (1999-12-01), Ohsawa
patent: 6438019 (2002-08-01), Hartner et al.
patent: 6541375 (2003-04-01), Hayashi et al.
patent: 6587367 (2003-07-01), Nishimura et al.
patent: 6639823 (2003-10-01), Hasegawa
patent: 6704218 (2004-03-01), Rickes et al.
patent: 6920060 (2005-07-01), Chow et al.
patent: 6967858 (2005-11-01), Kang
patent: 6982896 (2006-01-01), Kang
patent: 2002/0145903 (2002-10-01), Hasegawa
patent: 2004/0076031 (2004-04-01), Roehr et al.
patent: 2004/0233744 (2004-11-01), Rodriguez et al.
B. Yang et al. “Low Voltage Performance of Pb(Zr,Ti)O3 Capacitors Through Donor Doping” Appl. Phys. Lett., vol. 17. No. 25, Dec. 15, 1997 pp. 3578-3580.

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