Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate
2007-01-16
2007-01-16
Pert, Evan (Department: 2826)
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
Reexamination Certificate
active
10862515
ABSTRACT:
A method for dispersing and fixing particles on the bumps of a chip using an electrophoresis technology is provided. The particles and chip bumps are processed to carry charges by applying chemical bonding between metal and thiol with electric charges. The chip is placed in a reactor with a solution along with the conductive particles. The conductive particles are then migrated and fixed to the bonding locations on the bumps of a chip through an electrophoresis procedure. For conductive particles not carrying charges, they can sink naturally to the surface of chip bumps due to their higher density than water in the solution. An electroplating procedure is then applied to fix the conductive particles onto the bump.
REFERENCES:
patent: 5221417 (1993-06-01), Basavanhally
patent: 5336547 (1994-08-01), Kawakita et al.
patent: 5352318 (1994-10-01), Takabayashi et al.
patent: 5616206 (1997-04-01), Sakatsu et al.
patent: 5965197 (1999-10-01), Jin et al.
patent: 5980636 (1999-11-01), Okumura
patent: 6042894 (2000-03-01), Goto et al.
patent: 6331681 (2001-12-01), Okumura
patent: 6844048 (2005-01-01), Murari et al.
patent: 2005/0048697 (2005-03-01), Uang et al.
patent: 0691660 (1996-10-01), None
Chen Yu-Chih
Chen Yu-Hua
Uang Ruoh-Huey
Industrial Technology Research Institute
Pert Evan
LandOfFree
Method of migrating and fixing particles in a solution to... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of migrating and fixing particles in a solution to..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of migrating and fixing particles in a solution to... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3751057