Method of measuring test coverage of backend verification...

Details Method of measuring test coverage of backend verification... Method of measuring test coverage of backend verification...

2007-08-07

2007-08-07

Dinh, Paul (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

C716S030000

Reexamination Certificate

active

11229085

ABSTRACT:
The quality assurance of all released runset files should ideally be 100% complete to ensure the best quality of the runsets. This means that the designs used for testing should be sufficient to test all of the design rules with the appropriate data in the runset to reach 100% coverage, which is not easy to ensure. The present invention provides a methodology that addresses this problem by quantitatively measuring the test coverage of backend verification runsets. The methodology not only reports the uncovered rules, but also assists the quality assurance engineers in locating reasons as to why those rules are not covered and how coverage can be improved by designing appropriate test cases.

REFERENCES:
patent: 6324678 (2001-11-01), Dangelo et al.
patent: 6526546 (2003-02-01), Rolland et al.
patent: 6606735 (2003-08-01), Richardson et al.
patent: 6611946 (2003-08-01), Richardson et al.

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