Method of measuring semiconductor lead inductance by changing th

Details Method of measuring semiconductor lead inductance by changing th Method of measuring semiconductor lead inductance by changing th

1991-05-24

1992-11-03

Harvey, Jack B.

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

324533, 324158R, G01R 2726

Patent

active

051608936

ABSTRACT:
Measurements for inductance and capacitance at various frequencies have been made on semiconductor device to determine inductance of the leads of the device. The measurement methods involve a Time Domain Reflectometer in a unique application in which the leads of the device being measured are submerged in a liquid during measurements.

REFERENCES:
patent: 3942108 (1976-03-01), Potter

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