Method of measuring antenna reflector surface accuracy

Geometrical instruments – Straight-line light ray type – Process

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33174G, 33275R, 33293, 356237, G01N 2100, G01C 1500

Patent

active

039408582

ABSTRACT:
The antenna reflector whose surface is to be measured is mounted on a moderately level surface. A relatively thin full diameter template is located sequentially at n different locations in the antenna reflector. Spacers are disposed between the template and the reflector surface at each of the n locations. A graduated target is mounted on the template at the certral vertical axis of the reflector. A bench scope is supported and levelled on a table disposed a convenient distance from the target and sighted at the target at each of the n locations. At each of the n locations a height reading is made and measurements of the spacing between the template and reflector surface are made at m intervals along the template. These readings and measurements are recorded in a matrix of n rows and (m + 1) columns. The change in height reading is calculated for each position of the template and used to weight the associated m spacing measurements. The height readings and weighted spacing measurements are employed in a number of equations to obtain the root mean square error of the reflector surface.

REFERENCES:
patent: 944462 (1909-12-01), Osborne
patent: 3106782 (1963-10-01), Carroll
patent: 3352014 (1967-11-01), Kehke
patent: 3803626 (1974-04-01), Garrett
patent: 3848339 (1974-11-01), Strasbaugh

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