Measuring and testing – Vibration – By mechanical waves
Patent
1989-07-12
1991-11-05
Williams, Hezron E.
Measuring and testing
Vibration
By mechanical waves
73602, G01N 924
Patent
active
050622978
ABSTRACT:
A method of measuring a profile of an object wherein an ultrasonic wave is radiated from an ultrasonic transducer toward an object supported by a supporting member in the water filled in a water tank, and a wave reflected at the surface of the object is detected by the transducer, and an apparatus for carrying out the method. A traversing device moves the transducer sequentially to a plurality of measurement points on an arc equidistant from a predetermined rotational center while opposing the transducer to the predetermined rotational center. A supporting device moves the supporting member relative to the transducer and sets the object in the predetermined position under water. A control device delivers a drive signal to the traversing device to move the transducer sequentially to the measurement points, causes the transducer to radiate an ultrasonic wave when the transducer is in each of the measurement points, calculates a distance between the transducer and the surface of the object in accordance with a difference between the time the transducer radiates the ultrasonic wave and the time transducer receives the wave reflected at the surface of the object, calculates coordinates of each of the measurement points, and coordinates of the surface of the object corresponding to each of the measurement points from the calculated distance, and obtains the profile of the object from the calculated coordinates of the surface of the object at each of the measurement points.
REFERENCES:
patent: 3705772 (1972-12-01), Andreas
patent: 3911257 (1975-10-01), Whitehouse et al.
patent: 4049954 (1977-09-01), Da Costa Vieira et al.
patent: 4127033 (1978-11-01), Warren et al.
patent: 4597294 (1986-07-01), Brill, III et al.
Hashimoto Nobuo
Saijo Teruaki
Suzuki Kunioki
501 Toray Industries, Inc.
Arana Louis M.
Williams Hezron E.
LandOfFree
Method of measuring a profile of an object and an apparatus for does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of measuring a profile of an object and an apparatus for , we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of measuring a profile of an object and an apparatus for will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-492234