Method of measurement of the rate of oxidation of a metal melt

Adhesive bonding and miscellaneous chemical manufacture – Delaminating processes adapted for specified product – Delaminating in preparation for post processing recycling step

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2503381, 2503383, 2503385, 374139, G01J 520

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active

048426741

ABSTRACT:
A process for measuring the rate of oxidation on the surface of a metal melt wherein the oxide skin on the melt surface is removed at constant temperature and the electromagnetic radiation during the subsequent oxidation is measured with an infra-red radiation pyrometer such that the variation in intensity of the electromagnetic radiation indicates the rate of oxidation. The process can also be employed for measuring the concentration in a metal melt of the elements influencing the rate of oxidation.

REFERENCES:
patent: 3493770 (1970-02-01), Dessauer et al.
patent: 4177094 (1979-12-01), Kroon
patent: 4421554 (1983-12-01), Mahn et al.
System for the Measurement of Spectral Emittance at High Temperature; Hyton et al.; AIAA Journal; vol. 14, No. 9, Sep. '76, 1303-1310.
Heteroepitaxial Semiconductors for Electronic Devices; Cullen et al.; Springer-Verlag, N.Y.; 1978 pp. 182-189.

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