Semiconductor device manufacturing: process – With measuring or testing – Electrical characteristic sensed
Reexamination Certificate
2006-02-07
2006-02-07
Wilczewski, Mary (Department: 2818)
Semiconductor device manufacturing: process
With measuring or testing
Electrical characteristic sensed
C438S017000, C438S054000, C438S460000
Reexamination Certificate
active
06995028
ABSTRACT:
A method of manufacturing thermal type flow sensing elements is provided which improves workability and reliability without increasing manufacturing costs. Each flow sensing element comprises two lead patterns that are connected to both ends of a heat generating resistance and two lead patterns that are connected to both ends of a temperature sensing resistance. The lead patterns connected to the ends of the heat generating resistance are both connected to dummy patterns in the vicinity of electrodes. As for the lead patterns connected to the ends of the temperature sensing resistance, either one of them is connected to the dummy pattern in the vicinity of the electrode. The dummy patterns are patterned so as to provide parallel connection of the heat generating resistances of a plurality of flow sensing elements formed on a substrate, through the lead patterns.
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Goodwin David
Sughrue & Mion, PLLC
Wilczewski Mary
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