Method of manufacturing semiconductor device

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – On insulating substrate or layer

Reexamination Certificate

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Details

C438S212000, C438S268000, C438S270000, C438S745000, C257S302000, C257SE21214, C257SE21228, C257SE21410

Reexamination Certificate

active

08043903

ABSTRACT:
A method of manufacturing a semiconductor device may include, but is not limited to the following processes. A first recess is formed in a semiconductor substrate to define an active region on the semiconductor substrate. The active region includes a protruding portion of the semiconductor substrate surrounded by the first recess. The protruding portion has a sloped side surface. A first insulating film that fills the first recess is formed. A gate recess is formed in the active region to form a thin film portion that upwardly extends. The thin film portion is positioned between the gate recess and the first insulating film. The thin film portion is a part of the protruding portion. An upper part of the thin film portion is removed by wet-etching to adjust a height of the thin film portion.

REFERENCES:
patent: 2007/0246774 (2007-10-01), Chung et al.
patent: 2009/0267125 (2009-10-01), Mikasa et al.
patent: 09-232535 (1997-09-01), None
patent: 2007-158269 (2007-06-01), None
patent: 2007-194333 (2007-08-01), None
patent: 2007-258660 (2007-10-01), None

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