Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate
2006-10-10
2006-10-10
Lebentritt, Michael (Department: 2812)
Active solid-state devices (e.g., transistors, solid-state diode
Test or calibration structure
C257SE23078, C324S757020
Reexamination Certificate
active
07119362
ABSTRACT:
In an electric characteristic testing process corresponding to a process of the semiconductor apparatus manufacturing processes, in order to test a large area of the electrode pad of the body to be tested in a lump, an electric characteristic testing is performed by pressing a testing structure provided with electrically independent projections having a number equal to a number of conductor portions to be tested formed on an area to be tested of a body to be tested to the body to be tested.
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Akashi Teruhisa
Ariga Akihiko
Ban Naoto
Endo Yoshishige
Harada Takeshi
Antonelli, Terry Stout and Kraus, LLP.
Lebentritt Michael
Renesas Technology Corp.
Stevenson Andre′
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