Semiconductor device manufacturing: process – Chemical etching – Combined with coating step
Reexamination Certificate
2007-03-20
2007-03-20
Fourson, George (Department: 2823)
Semiconductor device manufacturing: process
Chemical etching
Combined with coating step
C438S692000, C438S183000, C977S755000, C977S758000, C977S773000
Reexamination Certificate
active
11240473
ABSTRACT:
Provided is a method of manufacturing a nano scale semiconductor device, such as a nano scale P-N junction device or a CMOS using nano particles without using a mask or a fine pattern. The method includes dispersing uniformly a plurality of nano particles on a semiconductor substrate, forming an insulating layer covering the nano particles on the semiconductor substrate, partly removing the upper surfaces of the nano particles and the insulating layer, selectively removing the nano particles from the insulating layer, and partly forming doped semiconductor layers in the semiconductor substrate by partly doping the semiconductor substrate through spaces formed by removing the nano particles.
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*Korean Office Action dated Mar. 17, 2006.
Choi Byoung-Iyong
Kim Hoon
Kim Won-joo
Song In-jae
Buchanan & Ingersoll & Rooney PC
Fourson George
Maldonado Julio J.
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