Metal working – Barrier layer or semiconductor device making
Patent
1997-08-13
1999-11-30
Monin, Jr., Donald L.
Metal working
Barrier layer or semiconductor device making
438471, 438908, 257913, H01L 2120
Patent
active
059934930
ABSTRACT:
Two or more processes selected from heat treatment for anihilation of oxygen donors, formation of a gettering region, and formation of a dopant-volatilization-prevention film are simultaneously performed in a common apparatus in accordance with the specifications of silicon wafers to be manufactured. Therefore, productivity can be improved.
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Kobayashi Norihiro
Takamizawa Shoichi
Dietrich Michael
Monin, Jr. Donald L.
Shin-Etsu Handotai & Co., Ltd.
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