Method of manufacturing device, device, and electronic...

Semiconductor device manufacturing: process – Formation of semiconductive active region on any substrate – Fluid growth from liquid combined with subsequent diverse...

Reexamination Certificate

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Details

C438S301000, C438S478000, C438S500000, C438S501000

Reexamination Certificate

active

06884700

ABSTRACT:
A method of manufacturing a device comprising individual thin films including a silicon film, a gate insulating film, a conductive film for a gate electrode, an interlayer insulating film, and a conductive film for an electrode and wiring, comprising: a step of applying a liquid material to form an applied film; and a heat treatment and/or a light irradiating treatment of making the applied film into the silicon film, wherein, as the liquid material, a high-order silane composition comprising a high-order silence formed by photopolymerization by irradiating a silane compound solution having a photopolymerization property with UV rays is used.

REFERENCES:
patent: 6514801 (2003-02-01), Yudasaka et al.
patent: 6518087 (2003-02-01), Furusawa et al.
patent: 6734029 (2004-05-01), Furusawa
patent: 6767775 (2004-07-01), Yudasaka et al.
patent: 20020132454 (2002-09-01), Ohtsu et al.

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