Method of manufacturing an electronic device

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

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Details

C438S627000, C438S643000, C438S653000, C438S637000, C438S674000, C438S678000, C438S648000, C438S694000

Reexamination Certificate

active

07067424

ABSTRACT:
The present invention provides for a method of providing copper metallization on a semiconductor body, including the step of depositing copper in a nitrogen-containing atmosphere so as to form a nitrogen-containing copper seed layer and forming the copper metallization on the seed layer, and also including the step of heating the seed layer so as to release the nitrogen to form part of a barrier layer separating the seed layer from the semiconductor body.

REFERENCES:
patent: 6242349 (2001-06-01), Nogami et al.
patent: 6268291 (2001-07-01), Andricacos et al.
patent: 6368961 (2002-04-01), Lopatin et al.
patent: 6440854 (2002-08-01), Rozbicki
patent: 6554914 (2003-04-01), Rozbicki et al.
patent: 6955986 (2005-10-01), Li
patent: 2001/0051420 (2001-12-01), Besser et al.

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