Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate
2005-07-19
2005-07-19
Wilson, Christian (Department: 2829)
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
C438S629000, C438S685000
Reexamination Certificate
active
06919268
ABSTRACT:
WF6is used as a source gas of tungsten, and NH3is used as a source gas of nitrogen. The partial pressure of WF6is set to be higher than that of NH3. The substrate temperature is set to about 400° C. to 450° C. Tungsten nitride is deposited and then heated, to form a contact plug (106).
REFERENCES:
patent: 5487923 (1996-01-01), Min et al.
patent: 6133150 (2000-10-01), Nakajima et al.
patent: 6559050 (2003-05-01), McKee et al.
patent: 2002/0006739 (2002-01-01), Yamamoto
patent: 62-188268 (1987-08-01), None
patent: 11-102877 (1999-04-01), None
patent: 2000-188401 (2000-07-01), None
Kawano Yumiko
Yamasaki Hideaki
Crowell & Moring LLP
Tokyo Electron Limited
Wilson Christian
LandOfFree
Method of manufacturing a WN contact plug does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of manufacturing a WN contact plug, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of manufacturing a WN contact plug will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3432132