Method of manufacturing a vertical junction field effect...

Semiconductor device manufacturing: process – Making regenerative-type switching device – Having field effect structure

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S138000, C257SE29313

Reexamination Certificate

active

11071454

ABSTRACT:
A vertical junction field effect transistor includes a trench formed in an epitaxial layer. The trench surrounds a channel region of the epitaxial layer. The channel region may have a graded or uniform dopant concentration profile. An epitaxial gate structure is formed within the trench by epitaxial regrowth. The epitaxial gate structure may include separate first and second epitaxial gate layers, and may have either a graded or uniform dopant concentration profile.

REFERENCES:
patent: 4003036 (1977-01-01), Jenne
patent: 6690040 (2004-02-01), Chaudhry et al.
patent: 6693314 (2004-02-01), Mitlehner et al.
patent: 6794251 (2004-09-01), Blanchard
patent: 6841812 (2005-01-01), Zhao
patent: 6855981 (2005-02-01), Kumar et al.
patent: 2003/0042538 (2003-03-01), Kumar et al.
patent: 2005/0056893 (2005-03-01), Hadizad
patent: 2005/0067630 (2005-03-01), Zhao
Phelps, Dopant ion implantation simulations in 4H-Silicon Carbide, Sep. 16, 2004, Modeling Simul. Mater. Sci. Eng. 12 (2004) 1139-1146.
J.H. Zhao, K. Tone, X. Li, P. Alexandrov, L. Fursin, and M. Weiner; 6A, 1kV 4H-SiC Normally-off Trenched-and-Implanted Vertical JFETs.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of manufacturing a vertical junction field effect... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of manufacturing a vertical junction field effect..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of manufacturing a vertical junction field effect... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3848940

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.