Semiconductor device manufacturing: process – With measuring or testing – Electrical characteristic sensed
Reexamination Certificate
2011-02-22
2011-02-22
Brewster, William M. (Department: 2823)
Semiconductor device manufacturing: process
With measuring or testing
Electrical characteristic sensed
C438S107000, C438S174000, C438S194000
Reexamination Certificate
active
07892865
ABSTRACT:
In a state of a first semiconductor integrated circuit device on which a first semiconductor integrated circuit board including a first mask ROM and a programmable ROM are mounted, an ultimate program determined by using the programmable ROM is stored in a second ROM of a second semiconductor integrated circuit board which is substantially similar in structure to the first semiconductor integrated circuit board, thereby manufacturing a second semiconductor integrated circuit device as an ultimate product.
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Segawa Tomoki
Yano Koji
Brewster William M.
Holtz Holtz Goodman & Chick PC
Mitsumi Electric Co. Ltd.
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