Method of manufacturing a single chip semiconductor...

Semiconductor device manufacturing: process – With measuring or testing – Electrical characteristic sensed

Reexamination Certificate

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C438S107000, C438S174000, C438S194000

Reexamination Certificate

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07892865

ABSTRACT:
In a state of a first semiconductor integrated circuit device on which a first semiconductor integrated circuit board including a first mask ROM and a programmable ROM are mounted, an ultimate program determined by using the programmable ROM is stored in a second ROM of a second semiconductor integrated circuit board which is substantially similar in structure to the first semiconductor integrated circuit board, thereby manufacturing a second semiconductor integrated circuit device as an ultimate product.

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patent: 2008/0049483 (2008-02-01), Horiuchi et al.
patent: 2008/0088000 (2008-04-01), Yuasa et al.
patent: 2001-267488 (2001-09-01), None

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