Method of manufacturing a semiconductor device whereby photomask

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Making electrical device

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430394, 430396, G03F 720

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active

057925917

ABSTRACT:
A method of manufacturing a semiconductor device whereby a photoresist layer is provided on a surface of a slice of semiconductor material, after which two photomasks corresponding to adjoining portions of a pattern to be formed in the photoresist are projected on the photoresist by means of a projection lens, with overlapping edges. Strip-shaped transparent end portions of the two photomasks which are situated within this edge and which overlap one another in projection are provided with strip-shaped connection patterns which overlap one another in projection and which exhibit a complementary transmittance in projection. To keep the quantity of computer data necessary for describing the photomasks comparatively small, the strip-shaped transparent end portions of the two photomasks overlapping one another in projection are provided at their edges only with strip-shaped connection patterns overlapping one another in projection.

REFERENCES:
patent: 4591540 (1986-05-01), Bohlen
patent: 5273850 (1993-12-01), Lee
patent: 5308741 (1994-05-01), Kemp
patent: 5364718 (1994-11-01), Oae

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