Method of manufacturing a semiconductor device, in which a photo

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Making electrical device

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430156, 430273, 430292, 430330, 430394, G03C 500

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047043474

ABSTRACT:
A method of manufacturing a semiconductor device, in which there is applied to a surface of a semiconductor substrate a base layer of photosensitive lacquer, which is coated with a top layer of photosensitive lacquer. By means of a first patterned irradiation, there is formed in the top layer a mask of which a contact copy is formed in the base layer during a second irradiation. A material which can be discolored is used for the top layer. During the first irradiation, the top layer is locally discolored, whereupon the layer thus discolored is used as a mask during the second irradiation. By the use of the discoloring top layer, additional processing steps, which would ensure from a wet development of the top layer, are avoided.

REFERENCES:
patent: 4251619 (1981-02-01), Kurita
patent: 4362809 (1982-12-01), Chen et al.
patent: 4555471 (1985-11-01), Barzynski et al.

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