Method of manufacturing a semiconductor device and...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

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C438S720000

Reexamination Certificate

active

08030207

ABSTRACT:
A method of manufacturing a semiconductor device has forming, in a dielectric film, a first opening and a second opening located in the first opening, forming a first metal film containing a first metal over a whole surface, etching the first metal film at a bottom of the second opening using a sputtering process and forming a second metal film containing a second metal over the whole surface, and burying a conductive material in the second opening and the first opening.

REFERENCES:
patent: 2002/0115287 (2002-08-01), Hashim et al.
patent: 2004/0127014 (2004-07-01), Huang et al.
patent: 2004/0152295 (2004-08-01), Cooney et al.
patent: 2005/0255691 (2005-11-01), Ding et al.
patent: 2008/0237029 (2008-10-01), Tang et al.
H. Sakai et al; “Novel PVD process of barrier metal for Cu interconnects extendable to 45nm node and beyond”; Advanced Metallization Conference AMC San Diego, Oct. 19, 2006; pp. 33-34.
G.S. Chen et al; “Phase formation behavior and diffusion barrier property of reactively sputtered tantalum-based thin films used in semiconductor metallization”; Thin Solid Films 353 (1999) pp. 264-273.

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