Semiconductor device manufacturing: process – Semiconductor substrate dicing – Having specified scribe region structure
Reexamination Certificate
2005-07-05
2005-07-05
Chaudhari, Chandra (Department: 2829)
Semiconductor device manufacturing: process
Semiconductor substrate dicing
Having specified scribe region structure
C438S465000, C438S977000
Reexamination Certificate
active
06913985
ABSTRACT:
A peeling layer (13) and semiconductor thin film (20a) are formed on a first substrate (11), individual support materials (19) are formed thereupon, grooves (23) penetrating the semiconductor thin film and reaching the peeling layer (13) are formed in the semiconductor thin film (20a) by etching using the individual support materials (19) as a mask so as to divide the semiconductor thin film (20a) into a plurality of semiconductor thin film pieces (20) and form a plurality of assemblies of the semiconductor thin film pieces (20) and the individual support materials (19) fixed thereto, the semiconductor thin film pieces (20) are separated from the first substrate (11) while the individual support materials (19) remain fixed to the semiconductor thin film pieces (20), and they are then affixed to a second substrate (31). The invention facilitates handling of semiconductor thin film pieces.
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“High Efficiency GaAs Thin Film Solar Cells by Peeled Film Technology”, Makoto Konagai et al.: Department of Physical Electronics, Tokyo Institute of Technology, 2-12-1, Ohokayama, Meguro-ku, Tokyo 152, Japan; Journal of Crystal Growth 45 (1978); 4 pages.
Abiko Ichimatsu
Fujiwara Hiroyuki
Ogihara Mitsuhiko
Sakuta Masaaki
Chaudhari Chandra
Oki Data Corporation
Rabin & Berdo P.C.
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