Method of manufacturing a multilayered doped conductor for a...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

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C438S652000, C438S629000, C438S637000

Reexamination Certificate

active

06858534

ABSTRACT:
A method of manufacturing a memory device addressing reliability and refresh characteristics through the use of a multilayered doped conductor described. The multilayered doped conductor creates a high dopant concentration in the active area close to the channel region. The rich dopant layer created by the multilayered doped conductor is less suspectible to depletion from trapped charges in the oxide. This improves device reliability at burn-in and lowers junction leakage, thereby providing a longer period between refresh cycle.

REFERENCES:
patent: 5976961 (1999-11-01), Jung et al.
patent: 5981332 (1999-11-01), Mandelman et al.
patent: 6066894 (2000-05-01), Yokozeki
patent: 6067680 (2000-05-01), Pan et al.
patent: 6130145 (2000-10-01), Ilg et al.
patent: 6177697 (2001-01-01), Cunningham
patent: 6225214 (2001-05-01), Lin
patent: 6323525 (2001-11-01), Noguchi et al.
patent: 6392303 (2002-05-01), Keeth
patent: 6410951 (2002-06-01), Fischer et al.

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