Method of manufacturing a glass passivation type semiconductor d

Adhesive bonding and miscellaneous chemical manufacture – Delaminating processes adapted for specified product – Delaminating in preparation for post processing recycling step

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29576W, 29580, 156657, 156662, 156663, 156648, 357 50, 427 93, 427272, H01L 21306, B44C 122, C03C 1500, C03C 2506

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046327282

ABSTRACT:
In a method of manufacturing a glass passivation type semiconductor device wherein a silicon semiconductor substrate of a first conductivity type is formed with a p-n junction by diffusing an impurity of a second conductivity type thereinto, recesses which reach the p-n junction are provided to expose the p-n junction in the recesses, and the exposed parts of the p-n junction are covered with a low-melting glass; a method of manufacturing a glass passivation type semiconductor device according to this invention consists in that, using a printing mask, a glass is deposited on a whole surface of a wafer except for an outer periphery of the wafer or predetermined parts thereof necessary for alingment at a subsequent step, with the glass films at the bottoms of said recesses and the p-n junction parts being rendered at least 10 .mu.m thick and glass films at the other parts being rendered 4-10 .mu.m thick, and that unnecessary portions of said glass films are thereafter removed by etching, using a photoresist as a mask.

REFERENCES:
patent: 3847687 (1974-11-01), Davidsohn
patent: 4104086 (1978-08-01), Bondur et al.

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