Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – Insulating material
Reexamination Certificate
2006-10-10
2008-09-16
Nhu, David (Department: 2818)
Active solid-state devices (e.g., transistors, solid-state diode
Housing or package
Insulating material
C257S306000, C257S310000, C257SE21489, C257SE21547, C257SE21647
Reexamination Certificate
active
07425761
ABSTRACT:
A method of manufacturing a dielectric layer for a capacitor including sequentially supplying and purging a first and a second precursor material for a first and a second predetermined amount of time, respectively, in an initial cycle, sequentially supplying and purging the first and the second precursor materials for a third predetermined amount of time, which is shorter than the first and/or second predetermined amount of time, in a post cycle, which follows the initial cycle, and repeating the initial and post cycles to form a dielectric layer having a predetermined thickness.
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Choi Jae-hyoung
Chung Jung-hee
Kang Sung-ho
Kim Young-min
Lee Seog-min
Lee & Morse P.C.
Nhu David
Samsung Electronics Co,. Ltd.
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