Semiconductor device manufacturing: process – Bonding of plural semiconductor substrates – Thinning of semiconductor substrate
Patent
1995-01-05
1998-09-08
Niebling, John
Semiconductor device manufacturing: process
Bonding of plural semiconductor substrates
Thinning of semiconductor substrate
438406, H01L 2176
Patent
active
058044957
ABSTRACT:
A silicon wafer for the volume production of integrated circuit devices has a lattice network of chip separating structure containing a plurality of rectangular-shaped cavities which is filled completely with silicon single crystals to form single crystal layer sections of the same height as the depth of the lattice network. Both the cavities and the single crystal layer sections are dimensioned to suit the planar dimensions of an integrated circuit device chip to be used for volume production.
REFERENCES:
patent: 3393349 (1968-07-01), Huffman
patent: 3797102 (1974-03-01), Huffman
patent: 4017341 (1977-04-01), Suzuki et al.
patent: 4567646 (1986-02-01), Ishikawa et al.
patent: 4851078 (1989-07-01), Short et al.
patent: 4857387 (1989-08-01), Eberhardt et al.
patent: 4962056 (1990-10-01), Yamaki et al.
patent: 5051378 (1991-09-01), Yagi et al.
patent: 5091330 (1992-02-01), Cambou et al.
patent: 5096854 (1992-03-01), Saito et al.
patent: 5420064 (1995-05-01), Okonogi et al.
Japanese Journal of Applied Physics, Silicon-on-Insulator Wafter Bonding-Wafer Thinning Technology Evaluations, Aug. 1989, No. 8, Part 1, pp. 1426-1443.
Journal of the Electrochemical Society (1986) Aug., No. 8, Manchester, NH, USA, A Field-Assisted Bonding Process for Silicon Dielectric Isolation, pp. 1673-1677.
English abstracts of Japanese Appln. No. 59-057450 filed Apr. 1984; Japanese Appln. No. 59-080940 filed May 1984; Japanese Appln. No. 59-104139 filed Jun. 1984; Japanese Appln. No. 61-090443 filed May 1986.
Kawai Ken-ichi
Saito Yuichi
Mitsubishi Materials Corporation
Mitsubishi Materials Silicon Corporation
Mulpuri S.
Niebling John
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