Method of making damascene diodes using sacrificial material

Semiconductor device manufacturing: process – Formation of semiconductive active region on any substrate

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257SE21017, C257SE21090, C257SE21102, C438S044000, C438S360000, C438S488000, C438S496000, C438S700000

Reexamination Certificate

active

07927977

ABSTRACT:
A method of making a semiconductor device includes forming a first layer comprising a seed material over an underlying layer, forming a second layer comprising a sacrificial material over the first layer, the sacrificial material being different from the seed material, patterning the first layer and the second layer into a plurality of separate features, forming an insulating filling material between the plurality of the separate features, removing the sacrificial material from the separate features to form a plurality of openings in the insulating filling material such that the seed material is exposed in the plurality of openings, and growing a semiconductor material on the exposed seed material in the plurality of openings.

REFERENCES:
patent: 5891778 (1999-04-01), Wen
patent: 5915167 (1999-06-01), Leedy
patent: 5937280 (1999-08-01), Wen
patent: 6429449 (2002-08-01), Gozalez et al.
patent: 6750091 (2004-06-01), Gozalez et al.
patent: 7285464 (2007-10-01), Herner et al.
patent: 7575984 (2009-08-01), Radigan et al.
patent: 7629247 (2009-12-01), Hsia et al.
patent: 2002/0163027 (2002-11-01), Skotnicki et al.
patent: 2004/0157354 (2004-08-01), Kuriyama et al.
patent: 2005/0012119 (2005-01-01), Herner et al.
patent: 2005/0052915 (2005-03-01), Herner et al.
patent: 2005/0062079 (2005-03-01), Wu et al.
patent: 2005/0098800 (2005-05-01), Herner et al.
patent: 2006/0087005 (2006-04-01), Herner
patent: 2006/0284237 (2006-12-01), Park et al.
patent: 2006/0292301 (2006-12-01), Herner
patent: 2007/0086235 (2007-04-01), Kim et al.
patent: 2007/0090425 (2007-04-01), Kumar et al.
patent: 2007/0164309 (2007-07-01), Kumar et al.
patent: 2008/0078984 (2008-04-01), Park et al.
patent: 2008/0316809 (2008-12-01), Herner
patent: 4-67671 (1992-03-01), None
patent: 6-334139 (1994-12-01), None
patent: 100 766 504 (2007-10-01), None
patent: WO 2007/067448 (2007-06-01), None
Office Action mailed Dec. 9, 2009 in U.S. Appl. No. 12/007,780.
U.S. Appl. No. 12/007,780, filed Jan. 15, 2008, Herner et al.
U.S. Appl. No. 12/007,781, filed Jan. 15, 2008, Dunton et al.
Office Action mailed May 27, 2009 in related U.S. Appl. No. 12/007,780.
Herner, S.B., “Low Temperature Deposition and Crystallization of Large-Grained Ge Films on TiN”, Electrochemical and Solid-State Letters, vol. 9(5), (2006), pp. G161-G163.
Herner, S.B. et al., “Homogeneous Tungsten Chemical Vapor Deposition on Silane Pretreated Titanium Nitride”, Electrochemical and Solid-State Letters, vol. 2(8), (1999), pp. 398-400.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of making damascene diodes using sacrificial material does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of making damascene diodes using sacrificial material, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of making damascene diodes using sacrificial material will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2690343

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.