Method of making contacts on an integrated circuit

Semiconductor device manufacturing: process – Chemical etching – Liquid phase etching

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

438754, H01L 21302, H01L 21461

Patent

active

059424486

ABSTRACT:
A method of forming a contact on a body of semiconductor material within an opening in a passivation layer of silicon carbide in which the contact is a bond pad of aluminum on the semiconductor body, a barrier layer of TiW on the bond pad and over a portion of the passivation layer around the bond pad, and a gold layer on the barrier layer. In forming the contact, the TiW barrier layer is etched with an aqueous solution of hydrogen peroxide and ethylene diamine tetraacetic acid.

REFERENCES:
patent: 4554050 (1985-11-01), Minford et al.
patent: 4782380 (1988-11-01), Shankar et al.
patent: 5244836 (1993-09-01), Lim
patent: 5726501 (1998-03-01), Matsubara

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of making contacts on an integrated circuit does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of making contacts on an integrated circuit, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of making contacts on an integrated circuit will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-466882

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.