Method of making a semiconductor device

Fishing – trapping – and vermin destroying

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

437192, 148DIG20, H01L 2144

Patent

active

051008360

ABSTRACT:
Disclosed is a method of making a semiconductor device that exemplarily comprises depositing a Ti/Pt layer onto a AuBe intermediate layer on a p-doped region of a semiconductor body. It also comprises depositing a Ti/Pt layer onto a n-doped region of the semiconductor body, or onto a AuGe intermediate layer on the n-doped region, followed by rapid thermal processing. Exemplarily, the device is a semiconductor laser, the n-doped region is InP, the p-doped region is InGaAs or InGaAsP, and RTP involves heating in the range 425.degree.-500.degree. C. for 10-100 seconds. The method comprises fewer processing steps than typical prior art methods, reduces the danger of fabrication error and of wafer breakage and, significantly, results in contacts that can be relatively thermally stable and can have very low specific contact resistance (exemplarily as low as 10.sup.-7 .OMEGA..multidot.cm.sup.2).

REFERENCES:
patent: 4595454 (1986-06-01), Dautremont-Smith
patent: 5036023 (1991-07-01), Dautremont-Smith et al.
"Electron Tunneling and Contact Resistance of Metal-Silicon Contact Barriers", by a. Y. C. Yu, Solid-State Electronics, Pergamon Press 1970, vol. 13, pp. 239-247.
"Ohmic Contacts to n--GaAs Using Graded Band Gap Layers of Ga.sub.1-x In.sub.x As Grown by Molecular Beam Epitaxy", by J. M. Woodall et al., Journal Vacuum Science Technology, 19(3), Sep./Oct. 1981, pp. 626-627.
"Extremely Low Resistance Non-Alloyed Ohmic Contacts to n--GaAs Using Compositionally Graded In.sub.x Ga.sub.1-x As Layers", by T. Nittono et al., Japanese Journal of Applied Physics, vol. 25, No. 10, Oct., 1986, pp. L865-L867.
"A Nonalloyed, Low Specific Resistance Ohmic Contact to n-InP", by W. C. Dautremont-Smith et al., Journal Vacuum Science Technology, B2 (4), Oct.-Dec. 1984, pp. 620-625.
"Mechanism of Catastrophic Degradation in InGaAsP/InP Double-Heterostructure Light Emitting Diodes with Ti/Pt/Au Electrodes", by O. Ueda et al., Journal Applied Physics, 54(11), Nov. 1983, pp. 6732-6739.
"The Design and Realization of a High Reliability Semiconductor Laser for Single-Mode Fiber-Optical Communication Links", by A. R. Goodwin et al., Journal of Lightwave Technology, vol. 6, No. 9, Sep. 1988, pp. 1424-1434.
"Sputtered Ni--P as an Ohmic Contact to n--InP, p--InGaAs and as a Diffusion Barrier", by A. Appelbaum et al., IEEE Transactions on Electron Devices, vol. ED--34, No. 5, May 1987, pp. 1026-1031.
"Heavily Si--Doped InGaAs Lattice-Matched to InP Grown by MBE", by T. Fujii et al., Electronics Letters, vol. 22, No. 4, 13th Feb. 1986, pp. 191-192.
"Pt/Ti/p--InGaAsP Nonalloyed Ohmic Contact Formed by Rapid Thermal Processing", by A. Katz et al., Journal Applied Physics, 65(11), Jun. 1, 1989, pp. 4319-4323.
"Pt/Ti/p--In.sub.0.53 Ga.sub.0.47 As Low-Resistance Nonalloyed Ohmic Contact Formed by Rapid Thermal Processing", A. Katz et al., Applied Physics Letters, 54(23) Jun. 5, 1989, pp. 2306-2308.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of making a semiconductor device does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of making a semiconductor device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of making a semiconductor device will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2259073

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.