Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Making named article
Patent
1977-10-31
1979-11-13
Kimlin, Edward C.
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Making named article
1566591, 156656, 1566661, 427164, 427165, 427250, 427255, 427259, G03C 500, C23F 102, G03C 550, B32B 3128
Patent
active
041742192
ABSTRACT:
A negative exposure mask is prepared by forming a positive mask image of a first metal layer on a transparent substrate and applying a layer of resist which is exposed through the back of the substrate and developed to form a lift-off mask. The lift-off mask is used to form a negative mask image of a second layer of metal on the substrate in the areas not covered by the first metal layer. The first metal layer is then etched away to leave the negative mask image on the substrate.
REFERENCES:
patent: 3615462 (1971-10-01), Szegho et al.
patent: 3661580 (1972-05-01), Mayaud
patent: 3669665 (1972-06-01), Faigenbaum et al.
patent: 3712816 (1973-01-01), Blome et al.
patent: 3745094 (1973-07-01), Greene
patent: 3878007 (1975-04-01), Feldstein et al.
patent: 4018938 (1977-04-01), Feder et al.
Andres Heinrich A.
Kolbe Hartmut F.
Schlagdenhaufen Horst
Schwarzbach Frank A.
Bunnell David M.
International Business Machines - Corporation
Kimlin Edward C.
Suro Pico Alfonso T.
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