Method of making a contact structure

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

438635, 438637, 438648, 438650, 438656, 438685, 438686, 438687, 438688, H01L 214763

Patent

active

061272574

ABSTRACT:
An improved contact structure and process for forming an improved contact structure for a semiconductor device. A metal (14) is formed on a first metal layer (12) positioned on a substrate (10) The metal (14) is a Group VIIB or Group VIII metal or metal oxide and increases the electrically conductive surface area (25) of the first metal layer (12). In one embodiment, a Group VIIB or Group VIII metal layer is deposited onto the first metal layer and the Group VIIB or Group VIII metal layer is anisotropically etched to form sidewall spacers (24). An insulating layer (16) is deposited overlying the first conductive layer (12) and the sidewall spacers (24). A via opening (18) is formed in the insulation layer (16) to expose a portion of the electrically conductive surface area (25). A second metal layer (22) fills the opening (18) and forms a metallurgical contact to the first metal layer (12).

REFERENCES:
patent: 4851895 (1989-07-01), Green et al.
patent: 4962060 (1990-10-01), Sliva et al.
patent: 4980034 (1990-12-01), Volfson et al.
patent: 4980752 (1990-12-01), Jones, Jr.
patent: 5000818 (1991-03-01), Thomas
patent: 5003428 (1991-03-01), Shepherd
patent: 5200360 (1993-04-01), Bradbury et al.
J. Armstrong, "Transition Metal Oxide Conductors in Integrated Circuits", IBM Technical Disclosure Bulletin vol. 20, No.11A (Apr., 1978) pp 4633.
Vadimsky, R.G., et al., "Ru and RuO.sub.2 as Electrical Contact Materials", J. Electrochem. Soc., Nov. 1979, vol. 126, 11, pp. 2017-2023.
M.L. Green, et al., "Chemical Vapor Deposition of Ruthenium and Ruthenium Dioxide Films", J. Electrochem. Soc., (132), 11, p. 2677, (1985).
Vadimsky, R.G., et al., "Ru and RuO2 as Electrical Contact Materials", J. Electrochem. Soc., Nov. 1979, vol. 126, No. 11, pp. 2017-2023.
Vossen et al., Thin Film Processes, Academic Press, 1978, pp. 12-13.
Wolf, et al., Silicon Processing for the VLSI Era, Lattice Press, vol. l, 1986, pp. 169-174.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of making a contact structure does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of making a contact structure, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of making a contact structure will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-194883

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.