Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – On insulating substrate or layer
Reexamination Certificate
2006-03-31
2008-11-11
Kebede, Brook (Department: 2823)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
On insulating substrate or layer
C257SE27112, C257SE29275, C257SE21618, C257SE21633
Reexamination Certificate
active
07449373
ABSTRACT:
A method for ion implanting a tip source and drain region and halo region for a tri-gate field-effect transistor is described. A silicon body is implanted, in one embodiment, from six different angles to obtain ideal regions.
REFERENCES:
patent: 4906589 (1990-03-01), Chao
patent: 4996574 (1991-02-01), Shirasaki et al.
patent: 5124777 (1992-06-01), Lee et al.
patent: 5338959 (1994-08-01), Kim et al.
patent: 5346839 (1994-09-01), Sundaresan
patent: 5391506 (1995-02-01), Tada et al.
patent: 5466621 (1995-11-01), Hisamoto et al.
patent: 5521859 (1996-05-01), Ema et al.
patent: 5543351 (1996-08-01), Hirai et al.
patent: 5545586 (1996-08-01), Koh
patent: 5563077 (1996-10-01), Ha et al.
patent: 5578513 (1996-11-01), Maegawa
patent: 5658806 (1997-08-01), Lin et al.
patent: 5701016 (1997-12-01), Burroughs et al.
patent: 5716879 (1998-02-01), Choi et al.
patent: 5739544 (1998-04-01), Yuki et al.
patent: 5804848 (1998-09-01), Mukai
patent: 5814895 (1998-09-01), Hirayama
patent: 5821629 (1998-10-01), Wen et al.
patent: 5827769 (1998-10-01), Aminzadeh et al.
patent: 5844278 (1998-12-01), Mizuno et al.
patent: 5888309 (1999-03-01), Yu
patent: 5899710 (1999-05-01), Mukai
patent: 5905285 (1999-05-01), Gardner et al.
patent: 6018176 (2000-01-01), Lim
patent: 6020244 (2000-02-01), Thompson et al.
patent: 6066869 (2000-05-01), Noble et al.
patent: 6163053 (2000-12-01), Kawashima
patent: 6252284 (2001-06-01), Muller et al.
patent: 6376317 (2002-04-01), Forbes et al.
patent: 6391782 (2002-05-01), Yu
patent: 6396108 (2002-05-01), Krivokapic et al.
patent: 6407442 (2002-06-01), Inoue et al.
patent: 6413802 (2002-07-01), Hu et al.
patent: 6413877 (2002-07-01), Annapragada
patent: 6459123 (2002-10-01), Enders et al.
patent: 6472258 (2002-10-01), Adkisson et al.
patent: 6475869 (2002-11-01), Yu
patent: 6475890 (2002-11-01), Yu
patent: 6483156 (2002-11-01), Adkisson et al.
patent: 6525403 (2003-02-01), Inaba et al.
patent: 6562665 (2003-05-01), Yu
patent: 6583469 (2003-06-01), Fried et al.
patent: 6611029 (2003-08-01), Ahmed et al.
patent: 6630388 (2003-10-01), Sekigawa et al.
patent: 6635909 (2003-10-01), Clark et al.
patent: 6642090 (2003-11-01), Fried et al.
patent: 6645797 (2003-11-01), Buynoski et al.
patent: 6657259 (2003-12-01), Fried et al.
patent: 6680240 (2004-01-01), Maszara
patent: 6689650 (2004-02-01), Gambino et al.
patent: 6706571 (2004-03-01), Yu et al.
patent: 6709982 (2004-03-01), Buynoski et al.
patent: 6713396 (2004-03-01), Anthony
patent: 6716684 (2004-04-01), Krivokapic et al.
patent: 6716690 (2004-04-01), Wang et al.
patent: 6730964 (2004-05-01), Horiuchi
patent: 6756657 (2004-06-01), Zhang et al.
patent: 6770516 (2004-08-01), Wu et al.
patent: 6774390 (2004-08-01), Sugiyama et al.
patent: 6787402 (2004-09-01), Yu
patent: 6787406 (2004-09-01), Hill et al.
patent: 6787854 (2004-09-01), Yang et al.
patent: 6790733 (2004-09-01), Natzle et al.
patent: 6794313 (2004-09-01), Chang
patent: 6794718 (2004-09-01), Nowak et al.
patent: 6798000 (2004-09-01), Luyken et al.
patent: 6800885 (2004-10-01), An et al.
patent: 6800910 (2004-10-01), Lin et al.
patent: 6803631 (2004-10-01), Dakshina-Murthy et al.
patent: 6812075 (2004-11-01), Fried et al.
patent: 6815277 (2004-11-01), Fried et al.
patent: 6821834 (2004-11-01), Ando
patent: 6831310 (2004-12-01), Mathew et al.
patent: 6833588 (2004-12-01), Yu et al.
patent: 6835614 (2004-12-01), Hanafi et al.
patent: 6835618 (2004-12-01), Dakshina-Murthy et al.
patent: 6838322 (2005-01-01), Pham et al.
patent: 6849884 (2005-02-01), Clark et al.
patent: 6858478 (2005-02-01), Chau et al.
patent: 6867460 (2005-03-01), Anderson et al.
patent: 6869868 (2005-03-01), Chiu et al.
patent: 6884154 (2005-04-01), Mizushima et al.
patent: 6885055 (2005-04-01), Lee
patent: 6897527 (2005-05-01), Dakshina-Murthy et al.
patent: 6921982 (2005-07-01), Joshi et al.
patent: 6974738 (2005-12-01), Hareland
patent: 6867433 (2006-03-01), Yeo et al.
patent: 2002/0011612 (2002-01-01), Hieda
patent: 2002/0036290 (2002-03-01), Inaba et al.
patent: 2002/0081794 (2002-06-01), Ito
patent: 2002/0166838 (2002-11-01), Nagarajan
patent: 2002/0167007 (2002-11-01), Yamazaki et al.
patent: 2003/0042542 (2003-03-01), Maegawa et al.
patent: 2003/0057486 (2003-03-01), Gambino et al.
patent: 2003/0067017 (2003-04-01), Ieong et al.
patent: 2003/0085194 (2003-05-01), Hopkins, Jr.
patent: 2003/0098488 (2003-05-01), O'Keeffe et al.
patent: 2003/0102497 (2003-06-01), Fried et al.
patent: 2003/0102518 (2003-06-01), Fried et al.
patent: 2003/0111686 (2003-06-01), Nowak
patent: 2003/0122197 (2003-07-01), Hwang et al.
patent: 2003/0143791 (2003-07-01), Cheong et al.
patent: 2003/0201458 (2003-10-01), Clark et al.
patent: 2003/0203579 (2003-10-01), Post et al.
patent: 2003/0227036 (2003-12-01), Sugiyama et al.
patent: 2004/0031979 (2004-02-01), Lochtefeld et al.
patent: 2004/0036126 (2004-02-01), Chau et al.
patent: 2004/0036127 (2004-02-01), Chau et al.
patent: 2004/0061178 (2004-04-01), Lin-Ming-Ren et al.
patent: 2004/0061187 (2004-04-01), Weber et al.
patent: 2004/0063262 (2004-04-01), Feudel et al.
patent: 2004/0094807 (2004-05-01), Chau et al.
patent: 2004/0099903 (2004-05-01), Yeo et al.
patent: 2004/0119100 (2004-06-01), Nowak et al.
patent: 2004/0166642 (2004-08-01), Chen et al.
patent: 2004/0180491 (2004-09-01), Arai et al.
patent: 2004/0191980 (2004-09-01), Rios et al.
patent: 2004/0195624 (2004-10-01), Liu et al.
patent: 2004/0197975 (2004-10-01), Krivokapic et al.
patent: 2004/0198003 (2004-10-01), Yeo et al.
patent: 2004/0217433 (2004-11-01), Yeo et al.
patent: 2004/0219780 (2004-11-01), Ohuchi
patent: 2004/0227187 (2004-11-01), Cheng et al.
patent: 2004/0238887 (2004-12-01), Nihey
patent: 2004/0256647 (2004-12-01), Lee et al.
patent: 2004/0262683 (2004-12-01), Bohr et al.
patent: 2004/0262699 (2004-12-01), Rios et al.
patent: 2005/0017377 (2005-01-01), Joshi et al.
patent: 2005/0035415 (2005-02-01), Yeo et al.
patent: 2005/0093067 (2005-05-01), Yeo et al.
patent: 2005/0093154 (2005-05-01), Kottantharayil et al.
patent: 2005/0118790 (2005-06-01), Lee et al.
patent: 2005/0127362 (2005-06-01), Zhang et al.
patent: 2005/0145941 (2005-07-01), Bedell et al.
patent: 2005/0156171 (2005-07-01), Brask et al.
patent: 2005/0156202 (2005-07-01), Rhee et al.
patent: 2005/0184316 (2005-08-01), Kim et al.
patent: 2005/0191795 (2005-09-01), Chidambarrao et al.
patent: 2005/0224797 (2005-10-01), Ko et al.
patent: 2005/0224800 (2005-10-01), Lindert
patent: 2005/0227498 (2005-10-01), Furukawa et al.
patent: 2005/0230763 (2005-10-01), Huang et al.
patent: 2006/0014338 (2006-01-01), Doris et al.
patent: 2006/0068590 (2006-03-01), Lindert et al.
patent: 0 623963 (1994-11-01), None
patent: 1 202 335 (2002-05-01), None
patent: 1 566 844 (2005-08-01), None
patent: 06177089 (1994-06-01), None
patent: 2003-298051 (2003-10-01), None
patent: WO 02/43151 (2002-05-01), None
International Search Report PCT/US03/26242.
International Search Report PCT/US03/39727.
International Search Report PCT/US03/40320.
International Search Report PCT/US2005/000947.
International Search Report PCT/US2005/010505.
International Search Report PCT/US2005/020339.
International Search Report PCT/US2005/033439.
International Search Report PCT/US2005/037169.
International Search Report PCT/US2004/032442.
International Search Report and Written Opinion PCT/US2006/000378.
International Search Report PCT/US2006/037643.
International Search Report and Written Opinion PCT/US2006/024516.
Sung Min Kim, et al., A Novel Multi-channel Field Effect Transistor (McFET) on Bulk Si for High Performance Sub-80nm Application, IEDM 04-639, 2004 IEEE, pp. 27.4.1-27.4.4.
Yang-Kyu Choi, et al., “A Spacer Patterning Technology for Nanoscale CMOS” IEEE Transactions on Electron Devices, vol. 49, No. 3, Mar. 2002, pp. 436-441.
W. Xiong, et al., “Corner Effect in Multiple-Gate SOI MOSFETs” 2003 IEEE, pp. 111-113.
Weize Xiong, et al., “Improvement of FinFET Electrical Characteristics by Hydrogen Annealing” IEEE Electron Device Letters, vol. 25, No. 8, Aug. 2004, XP-001198998, pp. 541-543.
Fu-Liang Yang, et al., “5nm-Gate Nan
Datta Suman
Doyle Brian S.
Kavalieros Jack T.
Majumdar Amlan
Blakely , Sokoloff, Taylor & Zafman LLP
Intel Corporation
Kebede Brook
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