Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-10-31
2006-10-31
Whitmore, Stacy A (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
07131076
ABSTRACT:
The present invention relates to a method of interactive visualization and parameter selection for engineering design. Initially, a nominal topology and associated design variables are set. The design variables are treated as being independent of each other for the purposes of a design variable sweep or sensitivity analysis to determine effects of changes in design variables on performance. The results of the sweep are presented to a designer, for example, by a suitable software tool including a graphical user interface. The designer selects design variables and revises their values based on the visually presented results of the sweep and effects a simulation using the revised values. If the results are satisfactory and a stopping condition is satisfied then the method is done. Otherwise, a determination must be made as to whether additional values can be changed or whether a new sweep must be effected. If a sweep is to be made, according the method of the present invention, an optional step is to change to topology prior to sweeping.
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Brotzel Dean
Sherstyuk Nick
Bever Hoffman & Harms LLP
Harms Jeanette S.
Synopsys Inc.
Whitmore Stacy A
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