Image analysis – Pattern recognition – Feature extraction
Reexamination Certificate
2011-03-29
2011-03-29
Perungavoor, Sath V (Department: 2624)
Image analysis
Pattern recognition
Feature extraction
C382S192000
Reexamination Certificate
active
07916949
ABSTRACT:
A method of inspecting granular material and an inspection device for conducting that method, wherein agents (10a,10b) to be inspected are imaged, the pixel value of each pixel of images thus picked up is digitized, a plurality of reference points are dispersed along the outlines of massive regions corresponding to the agents (10a,10b) in digital images, the numbers of other reference points that can be viewed through massive regions from individual reference points are counted, a reference point giving a minimum counted value is extracted as a base point, and the number of these base points is counted as the number of granular materials. Accordingly, the number of granular materials can be counted accurately even if a plurality of granular materials to be inspected overlap each other, are in contact with each other, or any agent having a groove in one surface is erected.
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Shirasawa Mitsuru
Vanegas Oscar
Greenblum & Bernstein P.L.C.
Panasonic Electric Works
Perungavoor Sath V
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