4. Image analysis
  5. Pattern recognition
  6. Feature extraction

Mitsuru Shirasawa

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Method of inspecting granular material and inspection device...

Image analysis – Pattern recognition – Feature extraction
Reexamination Certificate

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Programming apparatus of a visual inspection program

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2221714

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