Method of in-situ wafer cooling for a sequential WSI/alpha -Si s

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – Insulated gate formation

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438655, 438656, 438908, 438952, 20419217, H01L 2128

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active

057705151

ABSTRACT:
The present invention relates to a method of a sequencial WSi/.alpha.-Si sputtering process, more particularly to a method of in-situ wafer cooling for a sequencial WSi/.alpha.-Si sputtering process. A sputtering process of WSi and a sputtering process of .alpha.-Si are finished in a multi-chamber sputtering apparatus according to the invention; meanwhile, a wafer is cooled down by bolwing of inert gas before a process of sputtering .alpha.-Si starts. Thus, compared to traditional art of finishing WSi/.alpha.-Si sputtering in two apparatus, partial time of vacuuming and venting required in a sputtering process is saved according to the invention, thereby, shortening the production cycle time, reducing the possibility of wafer contamination, and suppressing the fabricating cost.

REFERENCES:
patent: 5332692 (1994-07-01), Saitoh et al.
patent: 5597458 (1997-01-01), Sanchez, Jr. et al.

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