Semiconductor device manufacturing: process – Introduction of conductivity modifying dopant into...
Reexamination Certificate
2007-08-08
2010-06-15
Bryant, Kiesha R (Department: 2891)
Semiconductor device manufacturing: process
Introduction of conductivity modifying dopant into...
C257S288000
Reexamination Certificate
active
07737009
ABSTRACT:
A method of forming an isolation trench structure is disclosed, the method includes forming an isolation trench in a semiconductor body associated with an isolation region, and implanting a non-dopant atom into the isolation trench, thereby forming a region to modify the halo profile in the semiconductor body. Subsequently, the isolation trench is filled with a dielectric material.
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patent: 2008/0286936 (2008-11-01), Zhao
Eller Manfred
Lee Yong Meng
Lindsay Richard
Bryant Kiesha R
Doyle John
Infineon - Technologies AG
Slater & Matsil L.L.P.
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