Method of identifying the point at which an integrated circuit f

Details Method of identifying the point at which an integrated circuit f Method of identifying the point at which an integrated circuit f

1996-08-28

2000-01-11

Ballato, Josie

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

G01R 3126

Patent

active

06014033&

ABSTRACT:
A test system (10) is provided that comprises a controller (14) which controls a test head (12) which comprises a pattern sequence controller (16). An integrated circuit (20) is tested through pin cards (18a) through (18n). A test program (32) operating in controller (14) operates to perform both functional and scanning tests on the integrated circuit (20). Scanning tests are provided for set-up, hold, pulse width, and maximum frequency.

REFERENCES:
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patent: 4890270 (1989-12-01), Griffith
patent: 5003256 (1991-03-01), Merrill
patent: 5099196 (1992-03-01), Longwell et al.
patent: 5457400 (1995-10-01), Ahmad et al.
patent: 5481549 (1996-01-01), Tokuyama
patent: 5630110 (1997-05-01), Mote, Jr.

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