Method of generating test program for operating...

Details Method of generating test program for operating... Method of generating test program for operating...

2007-08-06

2010-11-23

Siek, Vuthe (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

C716S030000

Reexamination Certificate

active

07840920

ABSTRACT:
According to the present invention, even a user lacking the knowledge of semiconductor testing apparatus can easily generate a test program, and easily perform alternation and correction of the test program. In the present invention, a microprogram of a spreadsheet software being one of the commonly used application software is used to create the test program. Therefore, even a user lacking the knowledge of semiconductor testing apparatus can easily generate a test program, and easily perform alternation and correction of the test program. When the alternation and the correction of the test program are performed, only setting conditions of each sheet are altered and corrected, and the alternation and the correction of the test program are easily performed.

REFERENCES:
patent: 6453276 (2002-09-01), Bauman
patent: 10-048300 (1998-02-01), None
patent: 2000-187064 (2000-07-01), None

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