Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-05-31
2005-05-31
Thompson, A. M. (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C703S013000
Reexamination Certificate
active
06901570
ABSTRACT:
A method of generating optimum skew corner models for a compact device model. A skew corner model refers to a fast or a slow device model, or even a fast-NFET slow-PFET model in which there is no continuos distribution for compact device model parameters. A model parameter's values are set so that the model will reproduce the fast or slow corner results of several circuits performance targets, and wherein each model parameter's value in the skew corner library is within the tolerance range of that model parameters.
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International Business Machines - Corporation
Kotulak, Esq. Richard M.
Scully Scott Murphy & Presser
Thompson A. M.
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