Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-06-05
2007-06-05
Lin, Sun James (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000
Reexamination Certificate
active
10898982
ABSTRACT:
A method and computer program for generating a capacitance value rule table, which simplifies generation of the capacitance value rule table for multilayer wiring having a complex dielectric constant structure are provided. In the method, construction data of wire adjacent to a wire of interest is extracted (S30), a common dielectric constant for a plurality of insulating film in the construction data is calculated (S32), and capacitance value rule table (F12) is created based on the common dielectric constant (s34).
REFERENCES:
patent: 4680220 (1987-07-01), Johnson
patent: 4924701 (1990-05-01), Delatorre
patent: 5045819 (1991-09-01), Balanis et al.
patent: 7081673 (2006-07-01), Hedrick et al.
patent: 2002-299456 (2002-10-01), None
patent: 2002-368088 (2002-12-01), None
Ohba Hisayoshi
Watanabe Jun
Fujitsu Limited
Lin Sun James
Staas & Halsey , LLP
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