Method of forming planar vacuum microelectronic devices with sel

Adhesive bonding and miscellaneous chemical manufacture – Delaminating processes adapted for specified product – Delaminating in preparation for post processing recycling step

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156653, 156656, 156657, 1566591, 156662, B44C 122, C23F 102, C03C 1500, C03C 2506

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051124360

ABSTRACT:
A method for forming on a substrate a microelectronic device having a first and second element. According to the method, a first conductive layer is deposited on the surface. Next, a cap material is deposited, then the first element and a first element cap are formed from the first conductive layer and the cap material respectively. A sacrificial material is conformally deposited, then a second conductive layer is conformally deposited. The second conductive layer is anisotropically etched to form the second element. Finally, the sacrificial material is anisotropically etched.

REFERENCES:
Brodie, Ivor, "Physical Considerations in Vacuum Microelectronics Devices," IEEE Transactions on Electron Devices, vol. 36, No. 11, Nov. 1989, 2641-2644.
Busta, H. H., J. E. Pogemiller and M. F. Roth, "Lateral Miniaturized Vacuum Devices," IEDM, 1989, 533-536.

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