Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate
2007-07-10
2007-07-10
Lebentritt, Michael (Department: 2812)
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
C438S623000, C438S624000, C438S637000, C257SE21495
Reexamination Certificate
active
11024631
ABSTRACT:
A method for forming a metal wiring of a semiconductor device. The method includes forming an etch stop layer on a semiconductor substrate, forming a first inter metal dielectric on the etch stop layer, and forming a second inter metal dielectric on the first inter metal dielectric. The method also includes forming a first photoresist pattern defining a via hole on the second inter metal dielectric, forming a via hole exposing the etch stop layer using the first photo resist pattern, and forming a second photoresist pattern defining a trench by exposing and developing the first photoresist pattern. The method further includes forming a trench by etching the second inter metal dielectric using the second photoresist pattern as a mask, removing the etch stop layer exposed through the via hole, and forming a metal wiring by filling the via hole and the trench.
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Dongbu Electronics Co. Ltd.
Lebentritt Michael
Lowe Hauptman & Berner LLP
Roman Angel
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