Method of forming metal lines in an integrated circuit having re

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

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438636, 438643, 438648, 438653, 438656, 438658, 438660, 438669, 438671, 438722, 438785, H01L 214763

Patent

active

061301558

ABSTRACT:
A method of forming metal lines is disclosed. The method comprises the steps of: forming a composite metal layer over a wafer, the composite metal layer having a top layer of titanium/titanium nitride; oxidizing the top layer of titanium/titanium nitride to form a layer of titanium oxide; and patterning and etching the composite metal layer to form the metal lines.

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