Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Insulative material deposited upon semiconductive substrate
Patent
1999-11-19
2000-12-05
Niebling, John F.
Semiconductor device manufacturing: process
Coating of substrate containing semiconductor region or of...
Insulative material deposited upon semiconductive substrate
438785, 438951, H01L 2131
Patent
active
061566721
ABSTRACT:
A method of forming a dielectric thin film pattern, comprises the steps of: depositing a dielectric thin film on a substrate having a resist pattern thereon by a vapor deposition method, wherein as a material for the dielectric thin film, at least one of CeO.sub.2, Sm.sub.2 O.sub.3, Dy.sub.2 O.sub.3, Y.sub.2 O.sub.3, TiO.sub.2, Al.sub.2 O.sub.3, and MgO is used; and removing the resist pattern whereby the dielectric thin film is patterned.
REFERENCES:
patent: 5190892 (1993-03-01), Sano
Fujibayashi Kei
Koshido Yoshihiro
Okawa Tadayuki
Takahashi Ryoichiro
Toyota Yuji
Ghyka Alexander G.
Murata Manufacturing Co. Ltd.
Niebling John F.
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