Chemistry: electrical and wave energy – Processes and products – Coating – forming or etching by sputtering
Reexamination Certificate
2005-04-12
2005-04-12
Versteeg, Steven (Department: 1753)
Chemistry: electrical and wave energy
Processes and products
Coating, forming or etching by sputtering
C204S298160
Reexamination Certificate
active
06878241
ABSTRACT:
Sputtering particles emitted from a target are ionized by the Penning ionization process. And the sputtering particles ionized are caused to fly in the direction of the substrate by a magnetic field formed by ambipolar diffusion due to a magnetic field generating means without scattering the particles to deposit the particles on the substrate. The partial pressure of a sputtering discharge gas in a discharge space is set to 1.3 Pa or less and a distance from the target to an ionization space is within twice the mean free path of the partial pressure of the sputtering discharge gas.
REFERENCES:
patent: 4971674 (1990-11-01), Hata
patent: 5160388 (1992-11-01), Legresy et al.
patent: 5178739 (1993-01-01), Barnes et al.
patent: 5234561 (1993-08-01), Randhawa et al.
patent: 6551471 (2003-04-01), Yamaguchi et al.
patent: 20020006477 (2002-01-01), Shishido et al.
patent: 20030000475 (2003-01-01), Voutsas et al.
patent: 20030143868 (2003-07-01), Yamaguchi et al.
patent: 20030190412 (2003-10-01), Koike et al.
patent: 7-9061 (1995-02-01), None
Kanai Masahiro
Koike Atsushi
Oya Katsunori
Yamaguchi Hirohito
Canon Kabushiki Kaisha
Fitzpatrick ,Cella, Harper & Scinto
Versteeg Steven
LandOfFree
Method of forming deposited film does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of forming deposited film, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of forming deposited film will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3375841