Method of forming crack trapping and arrest in thin film...

Semiconductor device manufacturing: process – Packaging or treatment of packaged semiconductor

Reexamination Certificate

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Details

C438S421000, C438S619000, C438S637000, C257SE21476

Reexamination Certificate

active

07491578

ABSTRACT:
The present invention relates to a process for preparing a robust crack-absorbing integrated circuit chip comprising a crack trapping structure containing two metal plates and a via-bar structure sandwiched between said plates.

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