Semiconductor device manufacturing: process – Packaging or treatment of packaged semiconductor – Making plural separate devices
Reexamination Certificate
2011-07-26
2011-07-26
Garber, Charles D (Department: 2812)
Semiconductor device manufacturing: process
Packaging or treatment of packaged semiconductor
Making plural separate devices
C228S179100
Reexamination Certificate
active
07985622
ABSTRACT:
A method of forming collapse chip connection bumps on a semiconductor substrate is provided. The method includes providing a semiconductor substrate having a plurality of bump vias on a top surface of the semiconductor substrate and electroplating the plurality of bump vias to form a plurality of via pads on the top surface of the semiconductor substrate. The method also includes disposing a plurality of solder microballs on the top surface of the semiconductor substrate, wherein each solder microball is placed on a corresponding via pad on the semiconductor substrate and reflowing the plurality of solder microballs to form the collapse chip connection bumps on the semiconductor substrate.
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“Micro-Ball Bumpng Technology for Flip Chip and TAB interconnections”, K. Tastsumi, K. Shimokawa, El Hashino, Y. Ohzeki, T. Nakamori and M. Tanaka; The International Jornal of Microcircuits and Electronic Packaging, vol. 22, No. 2, Second Quarter 1999.
“An Application of Micro-Ball Wafer Bumping to Double Ball Bump for Flip Chip Interconnection”Kohei Tatsumi, 2005 Electronic Components andTechnology Conference.
Azimi Hamid
Gurumurthy Charan
Nalla Ravi
Salama Islam
Garber Charles D
Intel Corporation
Stevenson Andre′ C
Winkle, PLLC
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