Method of forming an EEPROM device and structure therefor

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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C257S315000, C257SE29129, C257SE29300

Reexamination Certificate

active

07825454

ABSTRACT:
In one embodiment, an EEPROM device is formed to include a metal layer having an opening therethrough. The opening overlies a portion of a floating gate of the EEPROM device.

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patent: 7361530 (2008-04-01), Terasawa et al.
patent: 2007-263681 (2007-10-01), None

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